Researchers in Japan have created a non-volatile switching element that processes a bit in 40 picoseconds, according to a study published May 14 in the journal Science. The device outperforms conventional chips, which typically process a bit in less than a nanosecond.

The switching element was constructed from ultrathin layers of tantalum (Ta) and Mn3Sn deposited on a silica base. Mn3Sn is antiferromagnetic, giving it stable magnetic properties and resistance to interference from external magnetic fields. Tantalum, a refractory metal, can store and release electricity, contributing to the device’s functionality.

Unlike conventional processors, the non-volatile switching element does not require a continuous flow of electricity to retain magnetic information. In laboratory trials, it operated reliably after more than one billion switching cycles. The device also generated minimal additional heat compared with standard computing processors—a feature that could address waste heat, a major barrier to expanding data centers’ processing power.

During testing, researchers used an ultrafast pulse generator to create light pulses as brief as 60 picoseconds within the standard communication wavelength band. Each pulse passed through a high-speed photodetector known as a uni-traveling-carrier photodiode (UTD-PD). When the switching element received these pulses, the spins of electrons within the material shifted, producing a detectable magnetic signal.

The low power requirements and reduced thermal output suggest the device could lower the energy demands of future processors. According to the researchers, further reducing the thickness of the Mn3Sn layer could decrease power consumption even more. They also noted that a prototype chip based on this technology could be ready by 2030.

Challenges remain before commercialization. Tantalum is a rare metal already in high demand, which may pose supply constraints for large-scale production. The next step, the researchers said, is developing a commercially viable bulk manufacturing process. They added that the device must also be tested outside controlled laboratory environments, where external factors could influence its performance.